Engineering

Electron microscopy shows 'mouse bite' defects in semiconductors

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was the result of a collaboration ...

Computer Sciences

Don't panic: 'Humanity's last exam' has begun

When artificial intelligence systems began acing long-standing academic assessments, researchers realized they had a problem: the tests were too easy. Popular evaluations, such as the Massive Multitask Language Understanding ...

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