Mitigating damage caused by adding electrical contacts to sensitive semiconductors
Damage from adding electrical contacts to sensitive semiconductors can be mitigated using a buffer layer and optimized deposition.
Nov 30, 2021
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Damage from adding electrical contacts to sensitive semiconductors can be mitigated using a buffer layer and optimized deposition.
Nov 30, 2021
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An international research team featuring two Skoltech scientists has experimentally demonstrated that a long-standing explanation for low energy efficiency in lithium-ion batteries does not hold. The researchers explained ...
Sep 21, 2021
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Ceramics are resilient to heat and extreme environments, but they are fragile and crack easily. Recently, in a study published in Science Advances, researchers at Texas A&M University have discovered a self-healing mechanism ...
Sep 10, 2021
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An international team of researchers has devised a method to detect the degradation mechanism of lithium-ion batteries.
Sep 9, 2021
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Recently, there have been a number of electric vehicle (EV) battery fire incidents. Unlike the batteries used in small mobile devices, such as smartphones, the battery pack of an EV is composed of hundreds of battery cells, ...
Dec 4, 2020
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From electric cars that travel hundreds of miles on a single charge to chainsaws as mighty as gas-powered versions, new products hit the market each year that take advantage of recent advances in battery technology.
Jun 19, 2018
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An electron microscope is a type of microscope that uses a particle beam of electrons to illuminate a specimen and create a highly-magnified image. Electron microscopes have much greater resolving power than light microscopes that use electromagnetic radiation and can obtain much higher magnifications of up to 2 million times, while the best light microscopes are limited to magnifications of 2000 times. Both electron and light microscopes have resolution limitations, imposed by the wavelength of the radiation they use. The greater resolution and magnification of the electron microscope is because the wavelength of an electron; its de Broglie wavelength is much smaller than that of a photon of visible light.
The electron microscope uses electrostatic and electromagnetic lenses in forming the image by controlling the electron beam to focus it at a specific plane relative to the specimen. This manner is similar to how a light microscope uses glass lenses to focus light on or through a specimen to form an image.
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